Measurement of the elemental contents of Polymers brings you in-depth control
- X-ray fluorescence spectrometry (XRF)
- ICP-OES (Inductively coupled plasma Optical Emission Spectrometer)
- SEM-EDS (Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy)
Identification and qualification of contaminations or deviations of the standard polymer support optimization of your production processes. Our element techniques provides you knowledge to reduce failure costs.
Element analysis techniques like ICP-OES, X-ray XRF and SEM-EDS make it possible to identify and quantify a large number of elements down to ppm and often also ppb levels in just about any (polymer) matrix.